- Type: P75-E2 Spring Test Probe, E type conical head. Great replacement probes to extend the life of your test station.
- Specification: Head Diameter 1.3mm, Tube Diameter 1.02mm, Shank Diameter 0.74mm, Length 16.5mm, Drill Size: 1.4mm, Minimum Test Distance 1.91mm, Full Stroke 2.50mm, Spring Pressure 100g, Current 3A, Resistance 50m Ohm
- Made of high quality material, heat treated beryllium copper plunger, gold plated phosphor bronze barrel and gold plated stainless steel wire spring, good contact and durable to use.
- Necessary parts for PCB conductive testing to access components on printed circuit assemblies, and test stability and durability.
- Widely used for testing through-hole components, gold fingers(edge connectors) PCB and welding pads.
Product Specifications
| Specification | Details |
| Type | P75-E2 Spring Test Probe |
| Material | Brass |
| Plating Layer | Gold Plated |
| Color | Gold |
| Package | PE Bag |
| Current resistance | 50mΩ |
| MOQ | 100PCS |
| Payment | T/T |
| Delivery time | 5-10 days after receiving payment |
Test Probe Selection Guide
Test probes are available from many manufacturers with similar constraints. When selecting a test probe receptacle, the tip choice is the most critical consideration.
Detailed illustration of test probe components and construction
Various test probe tip types
Customization Options
At SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD., we offer comprehensive customization:
- Custom diameters to match your specific requirements
- Custom plating thicknesses for optimal conductivity and durability
- Custom mechanical specifications tailored to your application
All products include: Material traceability documentation and certificate of analysis for quality assurance.
Contact us to request samples or a quotation for your specific application requirements.
Our probe manufacturing facility
Quality control inspection
Packaged probes ready for shipment
